Universal Journal of Electrical and Electronic Engineering Vol. 7(4), pp. 227 - 233
DOI: 10.13189/ujeee.2020.070401
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Zinc Sulfide Waveguide Analysis

Abd-Alrahman Khalid ^*, Nabeil I. Fawaz
Department of Physics, College of Science, University Of Anbar, Iraq

ABSTRACT

The Maxwell equations are considered as fundamental formulation of wave propagation for a dielectric slab waveguide at frequencies in the IR region. In this article, the theoretical analysis of electromagnetic waves propagating through the zinc sulfide (ZnS) semiconductor planar waveguide at wavelength of 1 µm is reported using 2013 MATLAB software. Additionally, a comparison of the waveguide parameters using two modes namely transvers electric (TE) and transvers magnetic (TM) is demonstrated in details. This could be attributed to the interference of effective refractive index value. In particular, the penetration depth has demonstrated values of 0.2419 and 0.2445 µm for TE0 and TM0 modes at thickness of 2.69 µm, respectively. Subsequently, the effect of temperature on the effective reflective index has been elaborated. Furthermore, the propagation angles in TM modes exhibited lower values than TE modes with respect to the core thickness; and lower wavelength resulted in higher cutoff frequency with respect to the number of modes. While, the relation between neff and temperature for both TE and TM modes showed that TE mode exhibited advanced values as compared to TM mode. This work demonstrates a short pathway for a theoretical analysis of electromagnetic waves through ZnS planer waveguide using both TE and TM modes.

KEYWORDS
Planar Waveguide, Zinc Sulfide, Transvers Electric, Transvers Magnetic

Cite This Paper in IEEE or APA Citation Styles
(a). IEEE Format:
[1] Abd-Alrahman Khalid , Nabeil I. Fawaz , "Zinc Sulfide Waveguide Analysis," Universal Journal of Electrical and Electronic Engineering, Vol. 7, No. 4, pp. 227 - 233, 2020. DOI: 10.13189/ujeee.2020.070401.

(b). APA Format:
Abd-Alrahman Khalid , Nabeil I. Fawaz (2020). Zinc Sulfide Waveguide Analysis. Universal Journal of Electrical and Electronic Engineering, 7(4), 227 - 233. DOI: 10.13189/ujeee.2020.070401.