Universal Journal of Electrical and Electronic Engineering Vol. 2(1), pp. 18 - 22
DOI: 10.13189/ujeee.2014.020103
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Progression of Silicon Solar Cells Luminescence Diagnostic Methods

Radek Stojan ^*, Jiří Vaněk , Martin Malý
Department of Electrical and Electronic Technology, Brno University of Technology, 616 00 Brno, Czech Republic

ABSTRACT

Diagnostic of silicon solar cells defects is permanently one of most important steps in production of solar cells. Specify of diagnostic methods leads to a better understanding and more detailed analysis of manufactured cells. Luminescence methods of solar cells are fast and some of the most common methods today. According to the excitation method of luminescence radiation from silicon solar cells we talk about electroluminescence or photoluminescence methods. Spectral response of using CCD camera with those methods is in band-gap infrared wave length area. The main idea of this paper is to analyze emitted infrared radiation silicon solar cell under the forward bias by polarization spectroscopy. This analysis opens up for potential next new questions in diagnostics defects silicon solar cells by luminescence methods.

KEYWORDS
Luminescence, Polarization, CCD Camera, Solar Cell

Cite This Paper in IEEE or APA Citation Styles
(a). IEEE Format:
[1] Radek Stojan , Jiří Vaněk , Martin Malý , "Progression of Silicon Solar Cells Luminescence Diagnostic Methods," Universal Journal of Electrical and Electronic Engineering, Vol. 2, No. 1, pp. 18 - 22, 2014. DOI: 10.13189/ujeee.2014.020103.

(b). APA Format:
Radek Stojan , Jiří Vaněk , Martin Malý (2014). Progression of Silicon Solar Cells Luminescence Diagnostic Methods. Universal Journal of Electrical and Electronic Engineering, 2(1), 18 - 22. DOI: 10.13189/ujeee.2014.020103.