Universal Journal of Electrical and Electronic Engineering Vol. 6(3), pp. 147 - 150
DOI: 10.13189/ujeee.2019.060308
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Modelling Temperature Effect on (Transverse Electric) TE Mode Shape of Optical Silica Waveguide

Indrawan Arifianto ^*, Muhammad Rangga Hadisiswoyo , Ary Syahriar
Department of Electrical Engineering, Faculty of Science and Engineering, Al Azhar University of Indonesia, Indonesia

ABSTRACT

Theoretical approach to study the influence of temperature of the effective refractive index value for asymmetric nonlinear optical waveguides was developed. Waveguide structures are equipped with linear cladding and substrate. Numerical modeling and calculations were performed to measure the sensitivity of the effective refractive index core thickness for transverse electrical (TE) mode and transversal magnetic (TM) mode. Based on the results, which affect the waveguide refractive index value, we can also adjust the waveguide by varying the temperature value. The waveguide structure is completed by linear cladding and substrate.

KEYWORDS
Modelling, Temperature, Propagation Constant, Effective Refractive Index, Slab Waveguide, Asymmetric Waveguide

Cite This Paper in IEEE or APA Citation Styles
(a). IEEE Format:
[1] Indrawan Arifianto , Muhammad Rangga Hadisiswoyo , Ary Syahriar , "Modelling Temperature Effect on (Transverse Electric) TE Mode Shape of Optical Silica Waveguide," Universal Journal of Electrical and Electronic Engineering, Vol. 6, No. 3, pp. 147 - 150, 2019. DOI: 10.13189/ujeee.2019.060308.

(b). APA Format:
Indrawan Arifianto , Muhammad Rangga Hadisiswoyo , Ary Syahriar (2019). Modelling Temperature Effect on (Transverse Electric) TE Mode Shape of Optical Silica Waveguide. Universal Journal of Electrical and Electronic Engineering, 6(3), 147 - 150. DOI: 10.13189/ujeee.2019.060308.