Universal Journal of Plant Science Vol. 2(5), pp. 93 - 96
DOI: 10.13189/ujps.2014.020501
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Genetic Architecture of Yield Components Accessed Through Line × Tester Analysis in Wheat (Triticum Aestivum L.)

Rasheda Aslam ^1,*, Muneeb Munawar ¹, Abdus Salam ^2
1 Ayub Agricultural Research Institute, Pakistan
² University of Agriculture, Faisalabad, Pakistan

ABSTRACT

Line × tester analysis is one of breeding strategy to evaluate combining ability effects of genotypes and also to provide information regarding genetic mechanisms controlling certain traits. Three elite wheat lines were used as female parents viz. 9436, 9444 and 9452 and three wheat varieties viz. SH-2002, Sehar 2006 and Lasani 2008 as male parents to produce 9 F1 crosses. Parent line 9452 and tester SH-2002 were found good general combiner for yield and its components which are important in grain yield improvement. 9436 × SH-2002, 9444× SH-2002, 9452 ×Sehar 2006 and 9452 × Lasani 2008 were more promising hybrids for grain yield components. The combining ability studies indicate the existence of both additive and non-additive gene effects in genetic material. Thus selection should be practiced either for hybrid breeding or pure line wheat varieties after achieving desired homozygosity in succeeding generations(F₅-F₆).

KEYWORDS
Genetic Evaluation, Line × Tester Analysis, General Combining Ability, Specific Combining Ability

Cite This Paper in IEEE or APA Citation Styles
(a). IEEE Format:
[1] Rasheda Aslam , Muneeb Munawar , Abdus Salam , "Genetic Architecture of Yield Components Accessed Through Line × Tester Analysis in Wheat (Triticum Aestivum L.)," Universal Journal of Plant Science, Vol. 2, No. 5, pp. 93 - 96, 2014. DOI: 10.13189/ujps.2014.020501.

(b). APA Format:
Rasheda Aslam , Muneeb Munawar , Abdus Salam (2014). Genetic Architecture of Yield Components Accessed Through Line × Tester Analysis in Wheat (Triticum Aestivum L.). Universal Journal of Plant Science, 2(5), 93 - 96. DOI: 10.13189/ujps.2014.020501.