Universal Journal of Electrical and Electronic Engineering  

Universal Journal of Electrical and Electronic Engineering is an international peer-reviewed journal that publishes original and high-quality research papers in all areas of electrical and electronic engineering. As an important academic exchange platform, scientists and researchers can know the most up-to-date academic trends and seek valuable primary sources for reference.


ISSN: 2332-3280 (Print)

ISSN: 2332-3299 (Online)


Contact Us: ujeee.editor@hrpub.org or editor@hrpub.org

Website: http://www.hrpub.org/journals/jour_info.php?id=49


Archive

Volume 5   2017
Vol.5 No.1Vol.5 No.2Vol.5 No.3Vol.5 No.4
Volume 4   2016
Vol.4 No.1Vol.4 No.2Vol.4 No.3Vol.4 No.4Vol.4 No.5
Volume 3   2015
Vol.3 No.1Vol.3 No.2Vol.3 No.3Vol.3 No.4Vol.3 No.5Vol.3 No.6
Volume 2   2014
Vol.2 No.1Vol.2 No.2Vol.2 No.3Vol.2 No.4Vol.2 No.5Vol.2 No.6
Vol.2 No.7Vol.2 No.8
Volume 1   2013
Vol.1 No.1Vol.1 No.2Vol.1 No.3Vol.1 No.4

Vol 3(Mar, 2015) No 2

Study of Different Performance Parameters of Prototype Filter for Filter Bank Multicarrier Cognitive Radio

Er. A. S Kang, Renu Vig

[Abstract] [Full Text] [Full Article - PDF] pp. 31 - 38

DOI: 10.13189/ujeee.2015.030201

Application of Imperialist Competitive Algorithm for Optimal Location and Sizing of Static Compensator Considering Voltage Profile

Vahid Rashtchi, Ashkan Pirooz

[Abstract] [Full Text] [Full Article - PDF] pp. 39 - 48

DOI: 10.13189/ujeee.2015.030202

Modelling and Analysis of EMI Generated of Power IGBT Modules

Carmine Abbate, Roberto Di Folco

[Abstract] [Full Text] [Full Article - PDF] pp. 49 - 54

DOI: 10.13189/ujeee.2015.030203

Multi-baseline SAR Interferometry using Elaboration of Amplitude and Phase Data

Carmine Abbate, Roberto Di Folco, Annarita Evangelista

[Abstract] [Full Text] [Full Article - PDF] pp. 55 - 63

DOI: 10.13189/ujeee.2015.030204

Design, Simulate and Build a Photovoltaic-based Energy System for Mobile Device Chargers

Khuong Vinh Nguyen, Nam Nguyen-Quang

[Abstract] [Full Text] [Full Article - PDF] pp. 64 - 70

DOI: 10.13189/ujeee.2015.030205